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EpiEL-700 is optimized for rapid electroluminescence (EL) evaluation for LED epiwafers with optically transparent substrates， such as nitride-based LED on sapphire substrate. It has all functions of EpiEL-100 with additional capability for simulating different light extraction approaches. EpiEL-700 can also be used to investigate optical non-uniformity of material structures which leads to different emission intensity on both sides of the epiwafers.

EpiEL-700是為帶有光透明襯底的LED外延片快速電致發(fā)光評估設(shè)計的，例如在藍寶石襯底上的氮化物基LED。它有EpiEL-100的所有功能，另外附加模擬不同的光提取方法的功能。 EpiEL-700也可用于研究材料結(jié)構(gòu)的光學非均勻性，這種非均勻性導致外延片兩側(cè)產(chǎn)生不同的發(fā)射強度。